NUMERICAL CALCULATIONS OF IMPURITY SCATTERING MOBILITY IN SEMICONDUCTORS

Z. Chubinishvili, R. Kobaidze, E. Khutsishvili, N. Kekelidze

Abstract


Novel semiconductor-base nanotechnology is gradually moving into new applications in the world economy. Semiconductor application requires increasing of investigations in the direction of their properties. The main criterion of semiconductor suitability for application in semiconductor devices is its electrical properties, particularly current carriers mobility. Therefore, the problem connected with the explanation of the experimental results of current carriers mobility on the base of theoretical complicated formulas is very urgent. In the current paper current carriers mobility due to ionized impurity scattering is discussed and calculated using numerical methods. Calculations have been done for different temperatures and different range of current carriers concentration in InAs case.

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DOI: http://dx.doi.org/10.17628/ecb.2019.8.19-22

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